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Call for Papers: Few-shot Learning

Accelerating image-based plant phenotyping and pattern recognition: deep learning or few-shot learning?

In recent years, deep learning methods have played a great role in the plant sciences and achieved a series of remarkable achievements in many fields, such as yield prediction and estimation, crop pest identification, plant disease detection, physiological trait indication, seedling development monitoring, plant irrigation strategy, cultivar recognition, leaf counting, etc. However, the applications based on typical deep learning rely heavily on big-scale datasets requiring substantial manual annotation of training data, which is a serious shortcoming. After all, large-scale real-world agricultural datasets are time-consuming and expensive to collect and label by experts for every potential application. In order to alleviate this problem, few-shot learning is emerging, also called learning from few data. Few-shot learning is a new branch of deep learning, which aims to develop an intelligent model with good generalization from only few data, towards the combination of machine intelligence with flexibility and extensibility. Both deep learning and few-shot learning are technological explorations in the field of plant sciences that have the potential to greatly accelerate their applications. Therefore, we encourage you to share your research and opinions in this area and submit your paper to this thematic series. 

To facilitate community development and use of these methods, deposition of novel data and image sets in publicly accessible repositories is highly encouraged, as is new use of such publicly available data.

Topics of this article collection include, but are not limited to:

• Survey of deep learning and few-shot learning in the plant sciences and agriculture

• Advanced techniques and methods of deep learning and few-shot learning

• Root segmentation from complex backgrounds

• Path planning in the smart farms

• Plant diseases recognition

• Leaf area index estimation

• Plant status assessment

• Plant pests classification

• Plant yield prediction

• Plant irrigation strategy

• Special hardware architectures, software packages

Guest Editors:

Dr. Yang Li, Shihezi University, China

Prof. Jiachen Yang, Tianjin University, China

Dr. Francesco Marinello, University of Padua, Italy

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