Fig. 1From: Non-destructive, high-content analysis of wheat grain traits using X-ray micro computed tomographyTypical wheat spike, floret arrangement and grain traits. a Whole spike, b spikelet, c isolated grain, d grain cross section. Traits measured include: total height of the spike and grain position along the spike (a, b). Measured characteristics of isolated grains included grain length and width (c) as well as grain depth (d)Back to article page