Figure 1
From: A zoom into the nanoscale texture of secondary cell walls
Height/Phase/SNOM Image of a cross section of beech and the corresponding SNOM and height profiles. The height and the phase images of the cross section of beech wood (measurement position within the secondary wall (grey) is illustrated) show a very homogeneous surface in contrast to the SNOM image which reveals a clearly segmented circumferential lamellar structure and elongated nodule like features of different sizes. The height and SNOM profile indicate that the SNOM signal does not go along with the height signal (exclusion of height artifacts) and additionally the achieved resolution with SNOM of 120 nm is determined by using the FWHM (Full Width at Half Maximum) of the SNOM signal peak marked in the images and in the profiles.