Completing the picture of field-grown cereal crops: a new method for detailed leaf surface models in wheat

Table 1 Reconstructed leaf parameter of the planar leaf model

	Reference	\(\overline{x }\)	\(\sigma\)	Percentage change [%]	Variation coefficient
Leaf axis length [mm]	\(150\)	\(155.42\)	\(6.34\)	\(+3.6\)	\(\pm 4.2\)
Leaf width [mm]	\(11\)	\(10.74\)	\(1.32\)	\(-2.4\)	\(\pm 1.2\)
Leaf area [mm²]	\(1528\)	\(1371.23\)	\(78.54\)	\(-10.3\)	\(\pm 5.1\)

Reference values and reconstructed values \(\overline{x }\), standard deviation \(\sigma\), percentage change and variation coefficient: (i) for leaf axis length, (ii) width and (iii) leaf area averaged over all the reconstructed leaves

ISSN: 1746-4811