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Table 9 Chalkiness segmentation results of the weakly supervised Grad-CAM approach with ResNet-101 as backbone on unpolished rice

From: Deep learning based high-throughput phenotyping of chalkiness in rice exposed to high night temperature

Grad-CAM (ResNet-101)

GT-known Loc. Acc. (%)

Loc. Acc. (%)

Avg. IoU (%)

Layer

T (%)

polished model

7.92 = 019/240

7.92 = 19/240

26.79

layer2_0_

conv2

60

unpolished model

63.75 = 153/240

63.75 = 153/240

51.76

layer2_0_

conv2

60

mixed model

20.42 = 049/240

20.42 = 049/240

29.91

layer2_3_

conv2

60

  1. Only 240 chalky seed images in the Unpolished (12) test set were used for chalkiness segmentation evaluation. Performance is reported using the following metrics: Ground-Truth Localization Accuracy (GT-known Loc. Acc.), which represents the fraction of ground-truth chalky seed images with \(\text{ IoU } \ge 0.5\); Localization Accuracy (Loc. Acc.), which represents the fraction of ground-truth chalky images, with \(\text{ IoU } \ge 0.5\), correctly predicted by the model; Average IoU (Avg. IoU), which represents the average IoU for the set of chalky seed images. To calculate the IoU, the mask of the predicted chalkiness is obtained using a threshold \(T=60\%\) of the maximum pixel intensity. The last two columns show the layer that was used for generating the heatmap and the threshold used to binarize the heatmap when calculating IoU, respectively