Skip to main content
Fig. 4 | Plant Methods

Fig. 4

From: High-resolution spectral information enables phenotyping of leaf epicuticular wax in wheat

Fig. 4

Root Mean Square Error (RMSE in mg·dm−2) of the multivariate models (EWM) for predictions of epicuticular wax load utilizing the ground-based and aerial hyperspectral reflectance. The RMSE of prediction for the ground-based information is presented as the average response across the four sets of wheat inbreed lines evaluated. DS stands for data set 1 to 3 and Aerial corresponds to the hyperspectral information collected with the aircraft. (O-P)2 is the square of the difference between the observed minus the predicted values

Back to article page