Fig. 7
From: Multispectral and X-ray images for characterization of Jatropha curcas L. seed quality
Quality prediction of Jatropha curcas seeds based on reflectance at 940 nm and X-ray classes using a Linear Discriminant Analysis (LDA). a Plots partitioning two variables and apparent error rates; colored regions delineate each classification area and the observations (spots) within a region is predicted to be from a specific class. b Metrics used to validate the models based on accuracy, kappa, sensitivity and specificity