Fig. 4
From: Non-destructive phenotyping for early seedling vigor in direct-seeded rice
Result of linear regression analysis showing a positive correlation between whole-plant area by destructive-flatbed scanner (WPAs) and whole-plant area by non-destructive imaging (WPAi) at 14 and 28 days after sowing. The line indicates the fitted results representing the relationship between WPAs and WPAi