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Fig. 9 | Plant Methods

Fig. 9

From: Analysis of trace metal distribution in plants with lab-based microscopic X-ray fluorescence imaging

Fig. 9

Metal distribution in a root of soybean (G. max, cultivar ‘Galina’). a Tip of the lateral roots. The root was measured 120 times (cycles) by summing up the counts for each pixel, each cycle with 6 ms integration time per point and point distance of 8 µm. The machine enclosure had a He atmosphere but measuring chamber was with air to keep the root alive. Gaussian smoothing was applied to all element maps (sigma = 3 for all elements). b Older part of the same lateral root with an emerging root hair. This was measured with 80 cycles, each with 6 ms integration time per point and 4 µm point distance. Gaussian smoothing was applied to all element maps (sigma = 3 for all elements). The element maps of this figure are semi-quantitative, obtained by spectral deconvolution but without normalization to a standard. Images are in detector counts instead of concentration units

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