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Fig. 1 | Plant Methods

Fig. 1

From: A high-throughput phenotyping procedure for evaluation of antixenosis against common cutworm at early seedling stage in soybean

Fig. 1

Major technical procedures of the V1TMD method for evaluation of antixenosis against common cutworm in soybean seedlings. a The micro-netroom in greenhouse; b soybean seedlings at VE stage in seed nursery tray; c soybean seedlings at VC stage in seed nursery tray; d soybean seedlings at V1 stage, when canopy structure has formed and artificial infestation has started; e the average DLP of whole accessions is about 35% after artificial infestation; f the average DLP of whole accessions is about 50%; g the average DLP of whole accessions is about 70%; h the average DLP of whole accessions was about 80%; i the photo of highly resistant accession (59, Lamar) and highly susceptible accession (6, MYBMD)

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Plant Methods

ISSN: 1746-4811